Crystallography Online

X- Ray Diffraction

• Qualitative and quantitative phase analysis
• Cristallinity, crystallite size / strain
• Stress and texture determination
• Investigation of thin layers
• High temperature measurements

Consultation

• Optimization of X-ray methods, devices and additional tools
• Special problems / measurements of comparison
• in preparation for buying an X- ray diffractometer

Seminars / lectures

X- Ray diffraction

Devices, measurement optimization, sample preparation....

Equipment

theta/theta- Diffractometer

• Thin film attachment
• ½ Eulerian cradle
• High temperature attachment (1600°C)

theta/2theta- Diffractometer

• Routine analysis
• Sample changer

Transmission diffractometer

• Thin foils, small sample amounts, capillary technique
• High temperature attachment (900°C)

Westring 80
(Postfach 4108)
D - 64354 Reinheim near Darmstadt
Germany

Phone/Fax: 49 (6162) 837 56