Introducing myself: J"org Bergmann, Dresden, Germany

Dr. Joerg Bergmann ( bergmann@rcs.urz.tu-dresden.de )
Tue, 13 Feb 96 17:45:14 EST

Dear ladies and gentlemen,
since 1978 I'm dealing with X-ray powder diffracometry. My
task was developing a diagram-deconvolution/fitting program
for full pattern fitting, several years ago. To solve this in
accuracy, I have developed an expansive peak model for fitting.
This model was of no practical sense in east-germany until 1989
(because of the lack of computing power). Therefore it's still
unpublished until now. In 1993 I have finished this work.
The result, the program EFLECH, is now a commercial
product dealed by the firm Seifert-FPM in Freiberg
near my hometown Dresden. But there is no great interest.

In 1993, while demonstrating my results on a conference,
a scientist asked me: "Would You like to develop a Rietveld-
program using Your expansive peak model? I thought about,
and I did. The first, very incomplete program was running
in january 1994. I have complete redesigned the
code and the language of the input files. The program
is written in ANSI-C. The redesign was helpful for easy
implementation of many new features. Until now, there are
included many new and up-to-date features.

On of the best features, of course, is the expansive
profile model. With it's aim, we have reached R-values deep
below 10% even for large divergencies causing strong asymmetric
peaks. For example, we have reached <10% for an organic
transmission-specimen (thickness 1mm, horizontal divergence
slit also 1mm), which caused strong box-shaped->triangle-shaped
profiles.

The program is used in Prague, Freiberg, Dresden and Berlin
until now.

I'm going to hear some around in this mailing list, to get
a feeling about topics of discussion. Then, I will give
further information for my program.

Sincerely Your's

J"org Bergmann
bergmann@rcs1.urz.tu-dresden.de