A new X-Ray powder diffraction software is been developed. It's name is
XPwoder 1.0, and has been developed by researcher of the University of
Granada (Spain) with an expertise on X-Ray diffraction Analysis.
As soon as possible (probably for january, 1998), a beta version could
be send freely to everyone who could be interested.
This program can collect data from diffractometer (from any kind of
diffractometer), this software includes some analysis tools as:
* Authomatic zero correction using internals
patterns
* Authomatic Background correction
* Pattern adition and sustraction
* Quantitative analysis of preferential orientation
* Multiple phase identification:
By direct access to PDF1 or PDF2 using
CDRom Unit
by own database
Boolean and element search
* Refinement of cell parameters
* Indexation
* Output file (TREOR, DBWS, ASCII, GSAS...)
* Importation and exportation of file formats:
- Philips ASCII (UDF)
- Philips Raw Data
- Siemens format
- ASCII
- Erlangen format (DFA)
- PLV Format, etc...
For more information, please, see the internet home page of XPowder 1.0:
By filling the registration form, you can send us your diffractometer
model, and user file data format, to be
include in our program...Also, you will receive information about
XPowder 1.0, and, when available, the beta version of XPowder 1.0,
free......
There is no compromise by filling the registration form of the internet
page, it is only for create a database of interesting people and to
collect comments about the previews of the program and to get
information about diffractometers models used and new data file
formats...
Thanks a lot
-----------------------------------
Manuel J. Roman Alpiste
Depto. Mineralogia y Petrologia
Facultad de Ciencias (Universidad de Granada)
Avda. Fuentenueva, S/N
18002 Granada (Spain)
e-mail: x2524001@fedro.ugr.es
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