>Hi,
>We have recently purchased a Scintag X1 Powder Diffractometer. I would
>like start doing Rietveld analysis. May I know know what's the best
>standard to use? Also, I would like to be able to use GSAS to refine the
>data. Any suggestions would be helpful.. i.e. how to obtain an
>instrument parameter file...
>Thanks in advance.
>Julia Chan
>
The instrument parameter file is following. Perhaps profile function is not
the best but works fine as the first approximation.
INS BANK 1
INS DTYPE STND
INS HTYPE PXCR
INS 1 ICONS 1.540562 1.544390 0.0 0 0.500 0
INS 1 IRAD 3
INS 1I HEAD DUMMY INCIDENT SPECTRUM FOR X-RAY DIFFRACTOMETER
INS 1I ITYP 0 0.0000 180.0000 1
INS 1PRCF1 2 11 0.005
INS 1PRCF11 0.383793E+01 -0.508259E+01 0.293765E+01 0.146337E+01
INS 1PRCF12 0.351164E+01 0.000000E+00 0.000000E+00 0.235056E+01
INS 1PRCF13 0.000000E+00 0.000000E+00 0.000000E+00 0.000000E+00
Dr. Peter Y. Zavalij University Crystallographer
Materials Research Center, SUNY at Binghamton
Ph/Fax:(607)777-4623 E-mail:zavalij@binghamton.edu
http://imr.chem.binghamton.edu/zavalij/zavalij.html