Re: Guinier geometry and Rietveld

L. Cranswick ( L.M.D.Cranswick@dl.ac.uk )
Sat, 28 Mar 1998 22:39:24 +0000 (GMT)

Bit slow on the uptake here but on this topic people may like to check
out the following web page:

Automated Guinier Diffractometer
http://www.uni-tuebingen.de/uni/pki/guinier/guinier.html

This refers to Simref Rietveld and Simpro (Full Powder Pattern Fitting
Program) for data reduction.

http://www.uni-tuebingen.de/uni/pki/simref/simref.html
http://www.uni-tuebingen.de/uni/pki/simref/simpro.html

Lachlan.

PS: For people from places where the internet links to Germany are slow,
try the CCP14 auto-mirror of this software and web site at:
http://www.dl.ac.uk/CCP/CCP14/ccp/web-mirrors/pki/uni/pki/

> Well, I would talk directly to HUBER Diffraktionstechnik GMBH (Tel.: 49 8051
> 4472), a prominent manufacturer of Guinier diffractometers. Their latest
> advertisement in the IUCr Newsletter 5(4), 1997 reads "....the image plate
> detection scheme giving digital intensity data of the Guinier diffractogram
> within a couple of minutes, ready for Rietveld analysis." They should know
> more about it if this claim is true.
>
>
> Regards,
>
> Ludwig Keller
> CAMET Research, Inc.
> Goleta, CA
>
> 

-- Lachlan M. D. CranswickCollaborative Computational Project No 14 (CCP14)    for Single Crystal and Powder DiffractionDaresbury Laboratory, Warrington, WA4 4AD U.KTel: +44-1925-603703  Fax: +44-1925-603173  Room C14E-mail: l.cranswick@dl.ac.ukCCP14 Webpage (Under heavy reconstruction):   http://www.dl.ac.uk/CCP/CCP14/

Crystallographic Nexus Virtual Web and Internet on CD-ROM:     http://www.unige.ch/crystal/stxnews/nexus/index.htm