xfit/koalariet
Barwood, Henry ( (no email) )
Wed, 26 Aug 1998 09:50:23 -0500
I am trying to import diffraction patterns using the *.XDD format
(Easily translated from the JADE *.MDI output) into XFIT, but I have a
problem determining what diffractometer settings to use for the fit. The
data were collected by two methods: 1) a Phillips diffractometer with a
constant theta slit and 2) as digitized Debye-Scherrer and Guinier
films.
How do I set the Axial Divergence and other factors for the constant
theta slit?
What settings should I use for a synthetic diffractogram derived from a
film?
If anyone has any experience in these areas and can give me some advice,
it would save my attempting lots of "trial-and-error" runs.
Henry Barwood
Indiana Geological Survey