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[sdpd] New Search-Match Software announced



Dear Colleagues,

Crystal Impact announces its new Search-Match Software "MATCH!"

Match! is an easy-to-use software for phase identification from X-ray powder
diffraction data, which has become a daily task in material scientists work.
Match! compares the user's diffraction pattern to the patterns stored in the
ICDD PDF database in order to identify the phases which are present in the
user's sample.
Single as well as multiple phases can be identified based on both peak data
and raw (profile) data (if present). Peak lists can be obtained
automatically from the raw diffraction data and/or edited manually.
For routine application, the software offers an "Automatic" mode with
minimum required user interaction. For more demanding problems, the
"Expert"-mode provides full control of the raw data processing and phase
identification parameters.
If some knowledge about the sample is already present (like chemical
composition, color or density), it can be used as restraints in the
search-match process in order to focus on the most promising candidates.
This feature can also be used independent from search-match for general PDF
database retrievals.

A beta version will be presented at the annual meeting of the German
Crystallographic Society (DGK) in Berlin next week. The software will be
available in 3rd quarter 2003. For more details see
http://www.crystalimpact.com/match/

Best wishes

Michael Berndt

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Dr. Michael BERNDT
Crystal Impact GbR
Postfach 1251
D-53002 Bonn
Germany
Phone: +49 - 228 - 9813643
Fax: +49 - 228 - 9813644
Email: berndt...@crystalimpact.com
http://www.crystalimpact.com
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