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[sdpd] X'pert Epitaxy versus RADS

Hello,

We use a Philips/Panalytical MRD high resolution X-ray Diffractometer in our
laboratory to measure the properties of epitaxial thin films. We currently
use an old Philips software ('Epitaxy') to fit our rocking curves and would
like to upgrade to a fitting software with autofit capability.

Some people have recommended RADS software from Bede for its ease of use and
powerful fitting capability. The other option is to buy the most recent
version of X'pert Epitaxy.

Can anybody give me a comparison between these two softwares ?

Which one would be the most powerful and easy to use when simulating a
rocking curve?

Is there any formatting issues when transferring files from the Philips to
the Bede environment ?

X'pert Epitaxy provides more features (reciprocal space map plots, etc ...).
Do you think that it is worth it ?

Thanks for your help

Stéphane Gutierrez

Professionnel en caractérisation
IMSI / Laboratoire de caractérisation de Génie
Pavillon J. Armand Bombardier 

Local C1-2325
Sherbrooke (Québec)  J1K 2R1

Téléphone : (819) 821-8000 poste 2091
Téléavertisseur : (819) 577-0791
Télécopieur: (819) 821-8028
Courriel : stephane.gutierrez...@USherbrooke.ca
www.imsi.usherbrooke.ca





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