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[sdpd] 2nd Workshop on Combined Analysis

Dear Colleagues,

For the 2^nd year, we are organising the following workshop in Caen, France:

*Combined Analysis Using X-ray and Neutron Scattering*
July 4 -- 8, 2011, Caen(France)
Registration deadline : June 15, 2010

The Combined Analysis methodology is an approach allowing to extract as 
maximum information as possible from scattering patterns [preferred 
orientations (ODF, pole figures), residual stresses (homogeneisation 
models of elastic tensors), microstructures (iso- anisotropic sizes, 
microstrains, distributions, faults), phase analysis (crystalline or 
mixtures of crystallines/amorphous), structures, thickness and roughness 
(specular reflectivity)]. It uses algoritmics allowing individual 
algorithms to interact with each others to reach a global minimum for 
simulataneously all the refined parameters. The Rietveld method serves 
the core of the methodology, and all is integrated in the user-friendly 
MAUD software, this latter being the used software all along the workshop.
Each analysis type will be first described, then integrated in the 
combined approach, and each day of the workshop will be dedicated to one 
or two characterisation type (texture, reflectivity ...) and to its 
practice. Mornings will consist of courses, afternoons of practical 
training on computers.
Participants are encouraged to bring their own computers to ease future 
use when back home. All the materials will be downloadable prior to the 
workshop.

People working on real materials (time-consuming or hard to elaborate, 
rare, subjected to change under grinding or impossible to grind, films 
or multilayers, ...), are a priori interested by this workshop. Personal 
exemples can be brought to Caen, can be measured before or during the 
workshop.

For more informations about MAUD software, please visit the website : 
http://www.ing.unitn.it/~maud/ <http://www.ing.unitn.it/%7Emaud/>


For more informations about the workshop, please contact Inel company 
info...@inel.fr <mailto:info...@inel.fr> or visit the web site: 
http://www.inel.fr/news/page.asp?n=39

Sincerely.

Daniel Chateigner and Luca Lutterotti

-- 

----------------------------------------------------------------------
Daniel Chateigner
Professeur, Université de Caen Basse-Normandie
Editor: "Combined Analysis", Wiley-ISTE: http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html
Co-editor "Journal of Applied Crystallography", www.iucr.org
Editor-in-Chief "Texture, Stress and Microstructure", www.hindawi.com
----------------------------------------------------------------------
address: CRISMAT-ENSICAEN and IUT-Caen,
Université de Caen Basse-Normandie, campus 2
6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
fax: 33 (0)2 31 95 16 00
daniel.chateigner...@ensicaen.fr
http://www.ecole.ensicaen.fr/~chateign/danielc/
----------------------------------------------------------------------
An Open Source Material Properties database:
http://www.materialproperties.org/
An Open Source for Crystallographic Data: the COD
http://www.cristal.org/cod/
----------------------------------------------------------------------



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