Re: Guinier geometry and Rietveld

Larry W. Finger ( (no email) )
Mon, 16 Mar 1998 11:27:01 -0500

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At 02:59 PM 3/12/98 -0700, you wrote:
>Hi all,
>
>I am interested in refining x-ray spectra obtained from a Guinier
>diffractometer with a scintillation counter. Does anyone know if this is
>routine, and if so, does anyone have instrument parameters for the camera?
>The most helpful would be an instrument parameter file for GSAS, but any
>information and suggestions would be appreciated. Thank you.
>
> Sincerely,
>
> - Kurt Leinenweber
>

One note of caution for Guinier users. The axial-divergence asymmetry
parameters in GSAS will not work because they assume a constant sample to
detector distance, conditions that are not met in Guinier geometry,

Larry

--Larry W. Finger                     finger@gl.ciw.eduGeophysical Laboratory              Phone: +1 (202) 686-2410 X 24645251 Broad Branch Road N.W.         FAX:   +1 (202) 686-2419Washington, DC 20015-1305, USA         http://granite.ciw.edu/~finger/  http://btgix8.bgi.uni-bayreuth.de/~lafi

Previous message: Howard Flack: "Announcements to CWW - Crystallography World Wide"
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Next in thread: L. Cranswick: "Re: Guinier geometry and Rietveld"