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[sdpd] Combined Analysis Workshop
- Subject: [sdpd] Combined Analysis Workshop
- From: Daniel Chateigner <daniel.chateigner...@ensicaen.fr>
- Date: Thu, 04 Mar 2010 11:58:50 +0100
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Dear Colleagues,
We are organising the following workshop in Caen, France:
*Combined Analysis Using X-ray and Neutron Scattering*
June 28th - July 2nd, 2010, Caen (France)
Registration deadline : June 1st, 2010
Please visit the web site: http://www.inel.fr/news/page.asp?n=39
The Combined Analysis methodology is an approach allowing to extract as
maximum information as possible from scattering patterns [preferred
orientations (ODF, pole figures), residual stresses (homogeneisation
models of elastic tensors), microstructures (iso- anisotropic sizes,
microstrains, distributions, faults), phase analysis (crystalline or
mixtures of crystallines/amorphous), structures, thickness and roughness
(specular reflectivity)]. It uses algoritmics allowing individual
algorithms to interact with each others to reach a global minimum for
simulataneously all the refined parameters. The Rietveld method serves
the core of the methodology, and all is integrated in the user-friendly
software MAUD.
Each analysis type will be first described, then integrated in the
combined approach, and each day of the workshop will be dedicated to one
or two characterisation type (texture, reflectivity ...) and to its
practice. Mornings will consist of courses, afternoons of practical
training on computers.
Participants are encouraged to bring their own computers to easy future
use when back home. All the materials will be downloadable prior to the
workshop.
People working on real materials (time-consuming or hard to elaborate,
rares, subjected to change under grinding or impossible to grind, films
or multilayers, ...), are a priori interested by this workshop. Personal
exemples can be brought to Caen, can be measured before or during the
workshop.
sincerely
daniel
--
----------------------------------------------------------------------
Daniel Chateigner
Professeur, Université de Caen Basse-Normandie
Co-editor "Journal of Applied Crystallography", www.iucr.org
Editor-in-Chief "Texture, Stress and Microstructure", www.hindawi.com
----------------------------------------------------------------------
address: CRISMAT-ENSICAEN and IUT-Caen,
Université de Caen Basse-Normandie, campus 2
6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
fax: 33 (0)2 31 95 16 00
daniel.chateigner...@ensicaen.fr
http://www.ecole.ensicaen.fr/~chateign/danielc/
----------------------------------------------------------------------
A Quantitative Texture Analysis Course:
http://qta.ecole.ensicaen.fr/
An Open Source for Crystallographic Data: the COD
http://www.cristal.org/cod/
----------------------------------------------------------------------
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